Title :
Analysis of EME produced by a microcontroller operation
Author :
Fiori, Franco ; Musolino, Francesco
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Italy
Abstract :
This paper deals with the characterization of integrated circuit electromagnetic emissions. The TEM cell method is employed in order to identify primary emission sources of complex digital devices. An 8-bit microcontroller, realized by a 0.8 μm HCMOS process is considered. It is composed of several building blocks like the central processing unit, the analog to digital converter and the EPROM memory. Emission measurements are performed by operating a specific program code stored in the microcontroller memory and emissions due to each building block are identified
Keywords :
CMOS digital integrated circuits; electromagnetic interference; microcontrollers; 0.8 micron; 8 bit; EME; EPROM memory; HCMOS process; TEM cell method; analog to digital converter; central processing unit; microcontroller operation; primary emission sources; program code; Central Processing Unit; Circuits; Clocks; Electromagnetic radiation; Impedance; Microcontrollers; Power supplies; Pulsed power supplies; TEM cells; Testing;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915047
