• DocumentCode
    3016837
  • Title

    Minimizing stand-by leakage power in static CMOS circuits

  • Author

    Naidu, Srinath R. ; Jacobs, E.T.A.F.

  • Author_Institution
    Design Autom. Section, Eindhoven Univ. of Technol., Netherlands
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    370
  • Lastpage
    376
  • Abstract
    In this paper we concern ourselves with the problem of minimizing leakage power in CMOS circuits consisting of AOI (and-or-invert) gates as they operate in stand-by mode or an idle mode waiting for other circuits to complete their operation. It is known that leakage power due to sub-threshold leakage current in transistors in the OFF state is dependent on the input vector applied. Therefore, we try to compute an input vector that can be applied to the circuit in stand-by mode so that the power loss due to sub-threshold leakage current is the minimum possible. We employ a integer linear programming (ILP) approach to solve the problem of minimizing leakage by first obtaining a good lower bound (estimate) on the minimum leakage power and then rounding the solution to actually obtain an input vector that causes low leakage. The chief advantage of this technique as opposed to others in the literature is that it invariably provides us with a good idea about the quality of the input vector found
  • Keywords
    CMOS logic circuits; integer programming; leakage currents; linear programming; logic design; logic gates; low-power electronics; minimisation of switching nets; AOI gates; input vector; integer linear programming; power loss; stand-by leakage power minimisation; static CMOS circuits; subthreshold leakage current; transistors; CMOS technology; Circuits; Current measurement; Design automation; Integer linear programming; Leakage current; MOSFETs; Power measurement; Threshold voltage; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
  • Conference_Location
    Munich
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-0993-2
  • Type

    conf

  • DOI
    10.1109/DATE.2001.915051
  • Filename
    915051