DocumentCode
3016859
Title
Microscopic image classification via ℂWT-based covariance descriptors using Kullback-Leibler distance
Author
Keskin, Furkan ; Çetin, A. Enis ; Ersahin, Tulin ; Çetin-Atalay, Rengul
Author_Institution
Dept. of Electr. & Electron. Eng., Bilkent Univ., Ankara, Turkey
fYear
2012
fDate
20-23 May 2012
Firstpage
2079
Lastpage
2082
Abstract
In this paper, we present a novel method for classification of cancer cell line images using complex wavelet-based region covariance matrix descriptors. Microscopic images containing irregular carcinoma cell patterns are represented by randomly selected subwindows which possibly correspond to foreground pixels. For each subwindow, a new region descriptor utilizing the dual-tree complex wavelet transform coefficients as pixel features is computed. ℂWT as a feature extraction tool is preferred primarily because of its ability to characterize singularities at multiple orientations, which often arise in carcinoma cell lines, and approximate shift invariance property. We propose new dissimilarity measures between covariance matrices based on Kullback-Leibler (KL) divergence and L2-norm, which turn out to be as successful as the classical KL divergence, but with much less computational complexity. Experimental results demonstrate the effectiveness of the proposed image classification framework. The proposed algorithm outperforms the recently published eigenvalue-based Bayesian classification method.
Keywords
cancer; cellular biophysics; covariance matrices; feature extraction; image classification; medical image processing; microscopy; wavelet transforms; CWT based covariance descriptors; Kullback-Leibler distance; Kullback-Leibler divergence; L2 norm; cancer cell line images; carcinoma cell patterns; dissimilarity measurement; dual tree complex wavelet transform coefficient; eigenvalue based Bayesian classification; feature extraction; microscopic image classification; shift invariance property; wavelet based region covariance matrix descriptors; Cancer; Continuous wavelet transforms; Covariance matrix; Feature extraction; Microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location
Seoul
ISSN
0271-4302
Print_ISBN
978-1-4673-0218-0
Type
conf
DOI
10.1109/ISCAS.2012.6271692
Filename
6271692
Link To Document