DocumentCode
3016863
Title
14th Asian Test Symposium - Title Page
fYear
2005
fDate
18-21 Dec. 2005
Abstract
The following topics are dealt with: analog and RF testing; verification, on-line and software testing; self-checking; interconnect testing; BIST; SoC testing; yield enhancement; delay and defect-based testing; low power testing; fault diagnosis; test generation and fault simulation; design for testability; test compression and test compaction; fault modeling, processor testing, and memory testing
Keywords
automatic test pattern generation; built-in self test; design for testability; fault simulation; integrated circuit testing; integrated circuit yield; program testing; system-on-chip; BIST; RF testing; SoC testing; analog testing; defect based testing; design for testability; fault modeling; fault simulation; interconnect testing; low power testing; memory testing; on-line testing; processor testing; program verification; self-checking; software testing; test compaction; test compression; test generation; yield enhancement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2005. Proceedings. 14th Asian
Conference_Location
Calcutta
ISSN
1081-7735
Print_ISBN
0-7695-2481-8
Type
conf
DOI
10.1109/ATS.2005.4
Filename
1575379
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