Title :
14th Asian Test Symposium - Title Page
Abstract :
The following topics are dealt with: analog and RF testing; verification, on-line and software testing; self-checking; interconnect testing; BIST; SoC testing; yield enhancement; delay and defect-based testing; low power testing; fault diagnosis; test generation and fault simulation; design for testability; test compression and test compaction; fault modeling, processor testing, and memory testing
Keywords :
automatic test pattern generation; built-in self test; design for testability; fault simulation; integrated circuit testing; integrated circuit yield; program testing; system-on-chip; BIST; RF testing; SoC testing; analog testing; defect based testing; design for testability; fault modeling; fault simulation; interconnect testing; low power testing; memory testing; on-line testing; processor testing; program verification; self-checking; software testing; test compaction; test compression; test generation; yield enhancement;
Conference_Titel :
Test Symposium, 2005. Proceedings. 14th Asian
Conference_Location :
Calcutta
Print_ISBN :
0-7695-2481-8
