Title :
CT scans with neurocysticercosis in epileptics patients: a computer-based method for detection and quantification
Author :
Comunello, E. ; von Wangenheim, A. ; Barreto, J.M. ; Borges, P.S. ; Wille, P.R. ; Bittencourt, P.C. ; Krechel, D. ; Faber, K.
Author_Institution :
Fed. Univ. of Santa Catarina, Florianapolis, Brazil
Abstract :
We describe a computational method to assist radiologists in performing better more reliable and simpler diagnosis of neurocysticercosis (NC). Based on this method we implemented a software system that counts and measures the calcifications related to NC in computed tomography (CT) scans, thus reducing errors regarding visual inspection and providing better quantitative data. During computation, the system segments grey scale images obtained by CT scans and resulting segments are submitted to classification using artificial neural networks (ANNs). The system marks NC findings, replacing automatically all areas in the original image classified as NC with specially coloured markings. Afterwards, the system starts correlating NC-findings in different slices and performing a 3D reconstruction based on NC-classified areas belonging to the same finding. As a final step, the system performs a 3D reconstruction of the patient´s skull, encephalic mass and findings boundaries, generating a 3D representation of the patient´s head and the localisation of NC findings. In this step the volumes of each NC finding are also calculated
Keywords :
computerised tomography; image reconstruction; neural nets; neuromuscular stimulation; 3D reconstruction; CT scans; artificial neural networks; computed tomography; computer-based method; epileptics patients; grey scale images; neurocysticercosis; quantification; radiologists; software system; visual inspection; Artificial neural networks; Computed tomography; Computer networks; Epilepsy; Image reconstruction; Image segmentation; Inspection; Skull; Software measurement; Software systems;
Conference_Titel :
Computer-Based Medical Systems, 1999. Proceedings. 12th IEEE Symposium on
Conference_Location :
Stamford, CT
Print_ISBN :
0-7695-0234-2
DOI :
10.1109/CBMS.1999.781246