• DocumentCode
    3017151
  • Title

    Sparse deconvolution of ultrasonic NDE traces—a preliminary study

  • Author

    Zhang, Guang-Ming ; Harvey, David M. ; Braden, Derek R.

  • Author_Institution
    Gen. Eng. Res. Inst., Liverpool John Moores Univ., Liverpool
  • fYear
    2008
  • fDate
    2-5 Nov. 2008
  • Firstpage
    176
  • Lastpage
    179
  • Abstract
    The paper deals with the problem of deconvolving sparse ultrasonic NDE traces with time-varying pulses. A sparse dictionary learning algorithm is utilized to learn a time-varying pulse matrix. Each element of the matrix represents an individual pattern of possible local impulse responses. An ultrasonic signal is then decomposed into a sparse representation by the sparse Bayesian learning algorithm over the learned pulse matrix. The reflectivity sequence is finally estimated from the resulting sparse representation. The proposed method has been tested using NDE data taken from automotive thick film hybrid circuit boards.
  • Keywords
    Bayes methods; automotive electronics; circuit testing; deconvolution; electronic engineering computing; learning (artificial intelligence); matrix decomposition; nondestructive testing; signal representation; sparse matrices; thick film circuits; transient response; ultrasonic applications; automotive electronic circuit boards; automotive thick film hybrid circuit; local impulse responses; reflectivity sequence; sparse Bayesian learning algorithm; sparse deconvolution; sparse dictionary learning algorithm; sparse representation; time-varying pulse matrix; ultrasonic NDE traces; ultrasonic signal decomposition; Automotive engineering; Bayesian methods; Circuit testing; Deconvolution; Dictionaries; Matrix decomposition; Reflectivity; Sparse matrices; Thick films; Transmission line matrix methods; Deconvolution; sparse reflectivity sequence; sparse signal representation; time-varying pulse estimation; ultrasound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2008. IUS 2008. IEEE
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2428-3
  • Electronic_ISBN
    978-1-4244-2480-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2008.0043
  • Filename
    4803229