DocumentCode :
3017242
Title :
Suppression of transverse mode spurious in SAW resonators on an SiO2/Al/LiNbO3 Structure for wideband CDMA applications
Author :
Nakamura, H. ; Nakanishi, H. ; Tsurunari, T. ; Matsunami, K. ; Iwasaki, Y. ; Hashimoto, K. ; Yamaguchi, M.
Author_Institution :
Panasonic Electron. Devices Co., Ltd., Osaka
fYear :
2008
fDate :
2-5 Nov. 2008
Firstpage :
594
Lastpage :
597
Abstract :
The wideband CDMA (W-CDMA) system at 2 GHz has a wide duplex gap between transmitting (Tx) and receiving (Rx) bands. When developing a small-sized SAW duplexer for this application, one needs a substrate with a large electromechanical coupling factor (K2) and good temperature coefficient of frequency (TCF). An SiO2/Al/LiNbO3 structure meets these two requirements, it also supports a large electromechanical coupling factor (K2). However, certain number of unwanted spurious responses. They are categorized into two types; one is caused by the Rayleigh mode and the other by the transverse mode. This paper proposes a new technique to suppress the transverse mode spurious appearing in the SAW resonators on the SiO2/Al/LiNbO3 structure. In the technique, the dummy electrodes are only length-weighted in the form of a triangle, which selectively scatter higher-order transverse mode spurious. In addition, the SiO2 overlay is selectively removed from the dummy electrode region for enhancing the SAW energy confinement in the active electrode region. This technique was applied to an SAW resonator fabricated on a 5deg Y-X LiNbO3 substrate. We applied the proposed technique to the development of a miniature W-CDMA duplexer with the packaged size of 2.5 mm times 2.0 mm. The duplexer exhibited the excellent performance.
Keywords :
aluminium; broadband networks; code division multiple access; lithium compounds; silicon compounds; surface acoustic wave resonators; Rayleigh mode; SAW resonators; SiO2-Al-LiNbO3; active electrode region; electromechanical coupling factor; frequency 2 GHz; miniature W-CDMA duplexer; size 2.0 mm; size 2.5 mm; small-sized SAW duplexer; temperature coefficient; transverse mode; transverse mode spurious suppression; wideband CDMA application; Degradation; Electrodes; Frequency; Insertion loss; Multiaccess communication; Shape control; Substrates; Surface acoustic waves; Temperature; Wideband; Duplexer; LiNbO3; SAW; SiO2; Transverse Mode Spurious; W-CDMA;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2428-3
Electronic_ISBN :
978-1-4244-2480-1
Type :
conf
DOI :
10.1109/ULTSYM.2008.0142
Filename :
4803232
Link To Document :
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