Title :
Full chip false timing path identification: applications to the PowerPCTM microprocessors
Author :
Zeng, Jing ; Abadir, Magdy S. ; Bhadra, Jayanta ; Abraham, Jacob A.
Author_Institution :
ASP Somerset Design Center, Motorola Inc., Austin, TX, USA
Abstract :
Static timing anaylsis sets the industry standard in the design methodology of high speed/performance microprocessors to determine whether timing requirements have been met. Unfortunately, not all the paths identified using such analysis can be sensitized. This leads to a pessimistic estimation of the processor speed. Also, no amount of engineering effort spent on optimizing such paths can improve the timing performance of the chip. In the past we demonstrated initial results of how ATPG techniques can be used to identify false paths efficiently. Due to the gap between the physical design on which the static timing analysis of the chip is bused and the test view on which the ATPG techniques are applied to identify false paths, in many cases only sections of some of the paths in the full-chip were analyzed in our initial results. In this paper, we will fully analyze all the timing paths using the ATPG techniques, thus overcoming the gap between the testing and timing analysis techniques. This enables us to do false path identification at the full-chip level of the circuit. Results of applying our technique to the second generation G4 PowerPCTM will be presented
Keywords :
automatic test pattern generation; fault diagnosis; integrated circuit testing; logic testing; microprocessor chips; timing; ATPG techniques; PowerPC; design methodology; false timing path identification; industry standard; microprocessors; processor speed; static timing anaylsis; timing performance; Application software; Application specific processors; Automatic test pattern generation; Circuits; Delay; Design optimization; Jacobian matrices; Microprocessors; Performance analysis; Timing;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915072