DocumentCode
3017448
Title
A Boolean satisfiability-based incremental rerouting approach with application to FPGAs
Author
Nam, Gi-Joon ; Sakallah, Karem ; Rutenbar, Rob
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear
2001
fDate
2001
Firstpage
560
Lastpage
564
Abstract
Incremental redesign is an increasingly essential step in any complex design. Late changes or corrections in functional specifications (so-called “engineering change orders” or ECOs) force us to search for a minimal perturbation that achieves the desired repair. In reconfigurable design scenarios, these incremental repairs may be in response to physical faults: the goal is to “design around” the fault. For FPGAs, incremental rerouting is an essential component of this repair problem. We have developed a new incremental rerouting algorithm for FPGAs using techniques from Boolean Satisfiability (SAT). In this application, these techniques have the twin virtues that they (1) represent all possible routing (and rerouting) constraints simultaneously and exactly, and (2) search for rerouting solutions by perturbing all nets concurrently. Preliminary results are promising. For several FPGA benchmarks, we were able to reroute fault reconfigurations that perturb up to 5.74% of all nets for a small number of fault sets (one to four faults) with only 1.55 track overhead per channel on average, with CPU time 0.76 to 4.91 seconds/fault
Keywords
Boolean functions; circuit layout CAD; computability; field programmable gate arrays; high level synthesis; integrated circuit layout; network routing; Boolean satisfiability-based incremental rerouting; FPGAs; fault reconfigurations; functional specification changes; incremental redesign; repair problem; rerouting constraints; routing constraints; Application software; Design engineering; Electronic design automation and methodology; Error correction; Field programmable gate arrays; Logic design; Manufacturing; Reconfigurable logic; Routing; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location
Munich
ISSN
1530-1591
Print_ISBN
0-7695-0993-2
Type
conf
DOI
10.1109/DATE.2001.915079
Filename
915079
Link To Document