DocumentCode
3017485
Title
Negative ion source on the secondary emission electrons
Author
Bizioukov, A.A. ; Sereda, K.N. ; Sereda, N.D.
Author_Institution
Kharkov State Univ., Ukraine
fYear
1996
fDate
3-5 June 1996
Firstpage
223
Abstract
Summary form only given. The source of negative ions has been elaborated on the basis of the low pressure beam-plasma discharge. Negative ions are generated by electron-atom interaction (A+e/spl rarr/A/sup -/) and extracted across the magnetic field. The high concentration of low energetic electrons is reached with the help of secondary electron-electron emission by interaction of the primary stationary electron beam with target made of materials with high secondary emission rate. Secondary emission electrons is accumulating in electromagnetic trap like Penning cell with plug profile magnetic field. We have discovered that there are two operating conditions of the negative ion source that depend upon the correlation of discharge characteristics.
Keywords
ion sources; discharge characteristics; electromagnetic trap like Penning cell; electron-atom interaction; low pressure beam-plasma discharge; magnetic field; negative ion source; plug profile magnetic field; primary stationary electron beam; secondary electron-electron emission; secondary emission electrons; Charge carrier processes; Electromagnetic fields; Electron beams; Electron emission; Electron traps; Fault location; Ion sources; Magnetic fields; Magnetic materials; Plugs;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location
Boston, MA, USA
ISSN
0730-9244
Print_ISBN
0-7803-3322-5
Type
conf
DOI
10.1109/PLASMA.1996.550945
Filename
550945
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