• DocumentCode
    3017485
  • Title

    Negative ion source on the secondary emission electrons

  • Author

    Bizioukov, A.A. ; Sereda, K.N. ; Sereda, N.D.

  • Author_Institution
    Kharkov State Univ., Ukraine
  • fYear
    1996
  • fDate
    3-5 June 1996
  • Firstpage
    223
  • Abstract
    Summary form only given. The source of negative ions has been elaborated on the basis of the low pressure beam-plasma discharge. Negative ions are generated by electron-atom interaction (A+e/spl rarr/A/sup -/) and extracted across the magnetic field. The high concentration of low energetic electrons is reached with the help of secondary electron-electron emission by interaction of the primary stationary electron beam with target made of materials with high secondary emission rate. Secondary emission electrons is accumulating in electromagnetic trap like Penning cell with plug profile magnetic field. We have discovered that there are two operating conditions of the negative ion source that depend upon the correlation of discharge characteristics.
  • Keywords
    ion sources; discharge characteristics; electromagnetic trap like Penning cell; electron-atom interaction; low pressure beam-plasma discharge; magnetic field; negative ion source; plug profile magnetic field; primary stationary electron beam; secondary electron-electron emission; secondary emission electrons; Charge carrier processes; Electromagnetic fields; Electron beams; Electron emission; Electron traps; Fault location; Ion sources; Magnetic fields; Magnetic materials; Plugs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-3322-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1996.550945
  • Filename
    550945