Title :
Scalable behavior modeling for nano crossbar ESD protection structures by Verilog-A
Author :
Li Wang ; Xin Wang ; Zitao Shi ; Rui Ma ; Jian Liu ; Zongyu Dong ; Chen Zhang ; Fei Lu ; Lin, Li-Chiun ; Hui Zhao ; Wang, Aiping ; Yuhua Cheng
Author_Institution :
Dept. of EE, Univ. of California, Riverside, Riverside, CA, USA
Abstract :
This paper reports a new scalable behavioral modeling technique for novel nano crossbar ESD protection structures using Verilog-A language. Accurate models for nano crossbar ESD protection structures with different sizes were developed, which were validated by circuit level simulation and transmission line pulsing ESD measurement.
Keywords :
circuit simulation; electrostatic discharge; hardware description languages; transmission lines; ESD measurement; Verilog-A language; circuit level simulation; nanocrossbar ESD protection structures; scalable behavior modeling; transmission line pulsing; Arrays; Electrostatic discharges; Hardware design languages; Integrated circuit modeling; Nanoscale devices; Solid modeling; Testing;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-0675-8
DOI :
10.1109/NANO.2013.6720949
