• DocumentCode
    3017613
  • Title

    Small-sized SAW duplexers with wide duplex gap on a SiO2/Al/LiNbO3 structure by using novel Rayleigh-mode spurious suppression technique

  • Author

    Nakanishi, H. ; Nakamura, H. ; Hamaoka, Y. ; Kamiguchi, H. ; Iwasaki, Y.

  • Author_Institution
    Corp. Components Dev. Center, Panasonic Electron. Devices Co., Ltd., Osaka
  • fYear
    2008
  • fDate
    2-5 Nov. 2008
  • Firstpage
    1588
  • Lastpage
    1591
  • Abstract
    This paper describes the novel Rayleigh-mode spurious suppression technique for SAW duplexers with wide duplex gap on a SiO2/Al/LiNbO3 structure. We have cleared the optimum shape of SiO2 with taking account of the difference of the electrode thickness. The shape of SiO2 which can suppress the spurious depended on the thickness of Al electrode. By controlling the shape of SiO2, the Rayleigh-mode spurious of both Band I and Band IV duplexers can be suppressed. The small-sized SAW duplexers for Band I and Band IV systems were realized by employing this technology and optimizing the thickness of Al electrode. Our duplexers show the excellent performances for actually use. Insertion loss of transmitting band for Band I and for Band IV are 1.2 dB and 1.3 dB. And, the TCF is about -30 ppm/degC. The size of these duplexers is 2.5 mm times 2.0 mm. Additionally, the duplexers have sufficient power durability by using the multi-layer electrodes of AlMgCu/Ti.
  • Keywords
    aluminium; aluminium alloys; copper alloys; electrodes; lithium compounds; magnesium alloys; multilayers; multiplexing equipment; silicon compounds; surface acoustic wave devices; titanium; AlMgCu-Ti; Band I duplexer system; Band IV duplexer system; Rayleigh-mode spurious suppression technique; SiO2-Al-LiNbO3; insertion loss; multilayer electrodes; power durability; small-sized SAW duplexers; wide duplex gap; 3G mobile communication; Artificial intelligence; Attenuation; Circuits; Electrodes; Frequency; Insertion loss; Propagation losses; Shape control; Surface acoustic waves; Band I; Band IV; Duplexer; Rayleigh-mode spurious; the shape of SiO2;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2008. IUS 2008. IEEE
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2428-3
  • Electronic_ISBN
    978-1-4244-2480-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2008.0387
  • Filename
    4803247