Chip Identification using the Characteristic Dispersion of Transistor

With the miniaturization of the diffusion process and the emergence of new defects and new fault models, quality guarantee is becoming increasingly difficult. Research on chip ID (Identification) aiming at improving traceability is therefore actively pursued. This paper will discuss the properties of a method making use of the characteristic dispersion of transistor. We will show that our characteristic reasoning and corroborative results thoroughly coincide.