DocumentCode
3017944
Title
High sensitive THz Faraday rotation measurements in doped semiconductors
Author
Ikebe, Yohei ; Shimano, Ryo
Author_Institution
Univ. of Tokyo, Tokyo
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
We present a highly sensitive terahertz Faraday measurement scheme with the detection sensitivity of Faraday rotation as small as 1 mrad. The scheme was applied to n-doped Si to examine the carrier density and mobility.
Keywords
Faraday effect; carrier density; carrier mobility; elemental semiconductors; silicon; Si; carrier density; carrier mobility; detection sensitivity; terahertz Faraday rotation; Charge carrier density; Dielectrics; Electrochemical impedance spectroscopy; Faraday effect; Laser mode locking; Magnetic materials; Polarization; Rotation measurement; Submillimeter wave measurements; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/CLEO.2007.4453309
Filename
4453309
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