Title :
Error correction for semiconductor memories
Author :
Tolhuizen, Ludo ; Baggen, Stan
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fDate :
29 Jun-4 Jul 1997
Abstract :
We discuss an error correction method that is applicable to semiconductor memories for which the majority of errors is already present immediately after writing. Decoding can be performed much more easily than with an equally powerful conventional error correcting code
Keywords :
decoding; error correction codes; semiconductor storage; decoding; error correcting code; error correction method; semiconductor memories; writing errors; Decoding; Encoding; Error correction; Error correction codes; Feedback; Laboratories; Read-write memory; Semiconductor memory; Tail; Writing;
Conference_Titel :
Information Theory. 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Ulm
Print_ISBN :
0-7803-3956-8
DOI :
10.1109/ISIT.1997.613030
