Title :
Simulation-guided property checking based on multi-valued AR-automata
Author :
Ruf, Jürgen ; Hoffmann, Dirk W. ; Kropf, Thomas ; Rosenstiel, Wolfgang
Author_Institution :
Inst. of Comput. Eng., Tubingen Univ., Germany
Abstract :
The verification of digital designs, i.e., hardware or embedded hardware/software systems, is an important task in the design process. Often more than 70% of the development time is spent for locating and correcting errors in the design. Therefore, many techniques have been proposed to support the debugging process. Recently, simulation and test methods have been accompanied by formal methods such as equivalence checking and property checking. However their industrial applicability is currently restricted to small or medium sized designs or to a specific phase in the design cycle. In this paper, we present a method for verifying temporal properties of systems described in an executable description language. Our method allows the user to specify properties about the system in finite linear time temporal logic. These properties are translated to a special kind of finite state machines which are then efficiently checked on-the-fly during each simulation run. Properties may be placed anywhere in the system description and violations are immediately indicated to the designer
Keywords :
embedded systems; finite state machines; formal verification; hardware description languages; hardware-software codesign; multivalued logic; temporal logic; SystemC language; VHDL code; abstract model; digital design verification; embedded hardware/software systems; executable description language; finite linear time temporal logic; finite state machines; formal methods; hardware verification; multivalued AR-automata; simulation-guided property checking; state space reduction; temporal properties; Computational modeling; Computer errors; Design engineering; Embedded computing; Formal verification; Hardware; Logic; Power system modeling; Process design; System testing;
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
Print_ISBN :
0-7695-0993-2
DOI :
10.1109/DATE.2001.915111