Title :
A Unified Probabilistic Framework for Facial Activity Modeling and Understanding
Author :
Tong, Yan ; Liao, Wenhui ; Xue, Zheng ; Ji, Qiang
Author_Institution :
Rensselaer Polytech. Inst., Troy
Abstract :
Facial activities are the most natural and powerful means of human communication. Spontaneous facial activity is characterized by rigid head movements, non-rigid facial muscular movements, and their interactions. Current research in facial activity analysis is limited to recognizing rigid or non-rigid motion separately, often ignoring their interactions. Furthermore, although some of them analyze the temporal properties of facial features during facial feature extraction, they often recognize the facial activity statically, ignoring the dynamics of the facial activity. In this paper, we propose to explicitly exploit the prior knowledge about facial activities and systematically combine the prior knowledge with image measurements to achieve an accurate, robust, and consistent facial activity understanding. Specifically, we propose a unified probabilistic framework based on the dynamic Bayesian network (DBN) to simultaneously and coherently represent the rigid and non-rigid facial motions, their interactions, and their image observations, as well as to capture the temporal evolution of the facial activities. Robust computer vision methods are employed to obtain measurements of both rigid and non-rigid facial motions. Finally, facial activity recognition is accomplished through a probabilistic inference by systemically integrating the visual measurements with the facial activity model.
Keywords :
belief networks; computer vision; face recognition; feature extraction; dynamic Bayesian network; facial activity modeling; facial activity understanding; facial feature extraction; facial muscular movements; human communication; image measurements; robust computer vision; unified probabilistic framework; Bayesian methods; Computer vision; Face recognition; Facial features; Head; Humans; Motion analysis; Power engineering computing; Power system modeling; Robustness;
Conference_Titel :
Computer Vision and Pattern Recognition, 2007. CVPR '07. IEEE Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
1-4244-1179-3
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2007.383278