• DocumentCode
    3018211
  • Title

    Current-voltage characteristics of ballistic schottky barrier GNRFET and CNTFET: Effect of relative dielectric constant

  • Author

    Ziauddin Ahmed, Sheikh ; Shawkat, Mashiyat Sumaiya ; Chowdhury, Md Iramul Hoque ; Mominuzzaman, Sharif Mohammad

  • Author_Institution
    Dept. of Electr. & Electron. Eng., BRAC Univ., Dhaka, Bangladesh
  • fYear
    2015
  • fDate
    7-11 April 2015
  • Firstpage
    384
  • Lastpage
    387
  • Abstract
    Graphene Nanoribbon (GNR) and Carbon Nanotube (CNT) are currently being considered as two of the most promising options to replace silicon technology. Silicon technology is faced with scaling limits and other material issues which hinder the development of transistor technology. In this paper, the effect of relative dielectric constant on the performances of ballistic schottky barrier Graphene Nanoribbon field-effect transistor (GNRFET) and Carbon Nanotube field-effect transistor (CNTFET) is studied and a comparative analysis between the two transistors is provided. It has been observed that using a gate material with higher relative dielectric constant leads to a higher on-state drain current for both the transistors. However, CNTFET has higher on-state drain current compared to GNRFET. Also in this literature, the on and off-state current ratios of both the transistors are calculated and plotted to further differentiate between the performances of GNRFET and CNTFET.
  • Keywords
    Schottky barriers; carbon nanotube field effect transistors; graphene; nanoribbons; permittivity; CNTFET; ballistic Schottky barrier GNRFET; ballistic Schottky barrier graphene nanoribbon field-effect transistor; carbon nanotube field-effect transistor; current-voltage characteristics; relative dielectric constant; silicon technology; transistor technology; CNTFETs; Dielectric constant; Graphene; Logic gates; Schottky barriers; Silicon; CNTFET; Carbon Nanotube; GNRFET; Graphene Nanoribbon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2015 IEEE 10th International Conference on
  • Conference_Location
    Xi´an
  • Type

    conf

  • DOI
    10.1109/NEMS.2015.7147449
  • Filename
    7147449