DocumentCode
3018216
Title
Model order-reduction of RC(L) interconnect including variational analysis
Author
Liu, Ying ; Pileggi, Lawrence T. ; Strojwas, Andrzej J.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1999
fDate
1999
Firstpage
201
Lastpage
206
Abstract
As interconnect feature sizes continue to scale to smaller dimensions, long interconnect can dominate the IC timing performance, but the interconnect parameter variations make it difficult to predict these dominant delay extremes. This paper presents a model order-reduction technique for RLC interconnect circuits that includes variational analysis to capture manufacturing variations. Matrix perturbation theory is combined with dominant-pole-analysis and Krylov-subspace-analysis methods to produce reduced-order models with direct inclusion of statistically independent manufacturing variations. The accuracy of the resulting variational reduced-order models is demonstrated on several industrial examples
Keywords
distributed parameter networks; integrated circuit interconnections; integrated circuit modelling; linear network analysis; matrix algebra; perturbation techniques; reduced order systems; variational techniques; IC timing performance; Krylov-subspace-analysis methods; RCL interconnect circuits; dominant-pole-analysis; interconnect parameter variations; manufacturing variations; matrix perturbation theory; model order-reduction; variational analysis; variational reduced-order models; Delay; Fluctuations; Integrated circuit interconnections; Manufacturing industries; Manufacturing processes; Permission; RLC circuits; Reduced order systems; Timing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location
New Orleans, LA
Print_ISBN
1-58113-092-9
Type
conf
DOI
10.1109/DAC.1999.781312
Filename
781312
Link To Document