• DocumentCode
    3018281
  • Title

    Test Data Compression with Partial LFSR-Reseeding

  • Author

    Fu, Yu-Hsuan ; Wang, Sying-Jyan

  • Author_Institution
    National Chung-Hsing University, Taichung, Taiwan
  • fYear
    2005
  • fDate
    18-21 Dec. 2005
  • Firstpage
    343
  • Lastpage
    347
  • Abstract
    The large amount of test data becomes a serious problem in SOC testing. In this paper, we propose a method to improve the LFSR reseeding based compression scheme. This method rearranges a given set of test data by merging and partitioning test cubes so that they can be decompressed with a fixed-length LFSR. The compression is done by eliminating repeated patterns in consecutive seeds. A singlepolynomial LFSR is used, so that the decompression process is simple and fast. Besides, it does not need an on-chip decoder. The compression method is very efficient, as experimental results show that it reduces 23.6% of stored data and 34.8% of transferred data compared with the previous methods.
  • Keywords
    Channel capacity; Circuit testing; Computer science; Decoding; Equations; Hardware; Merging; Test data compression; Vectors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2005. Proceedings. 14th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2481-8
  • Type

    conf

  • DOI
    10.1109/ATS.2005.105
  • Filename
    1575453