• DocumentCode
    3018297
  • Title

    CryptoScan: A Secured Scan Chain Architecture

  • Author

    Mukhopadhyay, Debdeep ; Banerjee, S. ; Roychowdhury, D. ; Bhattacharya, Bhargab B.

  • Author_Institution
    Indian Institute of Technology Kharagpur, India
  • fYear
    2005
  • fDate
    18-21 Dec. 2005
  • Firstpage
    348
  • Lastpage
    353
  • Abstract
    Scan based testing is a powerful and popular test technique. However the scan chain can be used by an attacker to decipher the cryptogram. The present paper shows such a side-channel attack on LFSR-based stream ciphers using scan chains. The paper subsequently discusses a strategy to build the scan chains in a tree based pattern with a selfchecking compactor. It has been shown that such a structure prevents such scan based attacks but does not compromise on fault coverage.
  • Keywords
    Boolean functions; Circuit faults; Circuit testing; Clocks; Computer architecture; Computer science; Cryptography; Design for testability; Hardware; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2005. Proceedings. 14th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2481-8
  • Type

    conf

  • DOI
    10.1109/ATS.2005.42
  • Filename
    1575454
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3018297