Title :
CryptoScan: A Secured Scan Chain Architecture
Author :
Mukhopadhyay, Debdeep ; Banerjee, S. ; Roychowdhury, D. ; Bhattacharya, Bhargab B.
Author_Institution :
Indian Institute of Technology Kharagpur, India
Abstract :
Scan based testing is a powerful and popular test technique. However the scan chain can be used by an attacker to decipher the cryptogram. The present paper shows such a side-channel attack on LFSR-based stream ciphers using scan chains. The paper subsequently discusses a strategy to build the scan chains in a tree based pattern with a selfchecking compactor. It has been shown that such a structure prevents such scan based attacks but does not compromise on fault coverage.
Keywords :
Boolean functions; Circuit faults; Circuit testing; Clocks; Computer architecture; Computer science; Cryptography; Design for testability; Hardware; Sequential analysis;
Conference_Titel :
Test Symposium, 2005. Proceedings. 14th Asian
Print_ISBN :
0-7695-2481-8
DOI :
10.1109/ATS.2005.42
