• DocumentCode
    3018377
  • Title

    Access pattern based local memory customization for low power embedded systems

  • Author

    Grun, Peter ; Dutt, Nikil ; Nicolau, Alex

  • Author_Institution
    Center for Embedded Comput. Syst., California Univ., Irvine, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    778
  • Lastpage
    784
  • Abstract
    Memory accesses represent a major bottleneck in embedded systems power and performance. Traditionally, the local memory relied on a large cache to store all the variables in the application. However, especially in large real-life applications, different types of data exhibit divergent types of locality and access patterns, with diverse locality and bandwidth needs. Traditional caches had to compromise between the different types of locality required by the access patterns, and trade-off performance against bandwidth requirement. Instead, our approach customizes the local memory architecture matching the diverse access patterns and locality types present in the application, to reduce the main memory bandwidth requirement, and significantly improve power consumption, without sacrificing performance. Our approach generated an average 30% memory power reduction without degrading performance on a set of large multimedia/general purpose applications and scientific kernels, over the best traditional cache configuration of similar size, demonstrating the utility of our algorithm
  • Keywords
    cache storage; embedded systems; low-power electronics; memory architecture; storage allocation; storage management; access pattern based local memory customization; diverse access patterns; local memory architecture; low power embedded systems; memory accesses; memory bandwidth requirement; memory power reduction; power consumption improvement; Bandwidth; Embedded system; Energy consumption; Energy management; Memory architecture; Memory management; Power generation; Prefetching; Random access memory; SDRAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
  • Conference_Location
    Munich
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-0993-2
  • Type

    conf

  • DOI
    10.1109/DATE.2001.915120
  • Filename
    915120