• DocumentCode
    3018446
  • Title

    Property-specific witness graph generation for guided simulation

  • Author

    Casavant, A. ; Gupta, A. ; Liu, S. ; Mukaiyama, A. ; Wakabayashi, K. ; Ashar, P.

  • Author_Institution
    NEC Corp., Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    799
  • Abstract
    A practical solution to the complexity of design validation is semi-formal verification, where the specification of correctness criteria is done formally, as in model checking, but checking is done using simulation, which is guided by directed vector sequences derived from knowledge of the design and/or the property being checked. Simulation vectors must be effective in targeting the types of bugs designers expect to find rather than some generic coverage metrics. The focus of our work is to generate property-specific testbenches for guided simulation, that are targeted either at proving the correctness of a full CTL property or at finding a bug. This is facilitated by generation of a property-specific model, called a “witness graph”, which captures interesting paths in the design. Starting from an initial abstract model of the design, symbolic model checking, pruning, and refinement steps are applied in an iterative manner, until either a conclusive result is obtained or computing resources are exhausted. The witness graph is annotated with, e.g., state or transition priorities before testbench generation. The overall testbench generation flow, and the iterative flow for witness graph generation are shown
  • Keywords
    formal verification; graph theory; logic testing; symbol manipulation; correctness criteria; design validation; directed vector sequences; full CTL property; guided simulation; initial abstract model; property-specific witness graph generation; pruning; refinement steps; semi-formal verification; symbolic model checking; transition priorities; Boolean functions; Computational modeling; Computer bugs; Concrete; Data structures; Gold; National electric code; Performance analysis; Testing; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
  • Conference_Location
    Munich
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-0993-2
  • Type

    conf

  • DOI
    10.1109/DATE.2001.915124
  • Filename
    915124