DocumentCode :
3018446
Title :
Property-specific witness graph generation for guided simulation
Author :
Casavant, A. ; Gupta, A. ; Liu, S. ; Mukaiyama, A. ; Wakabayashi, K. ; Ashar, P.
Author_Institution :
NEC Corp., Japan
fYear :
2001
fDate :
2001
Firstpage :
799
Abstract :
A practical solution to the complexity of design validation is semi-formal verification, where the specification of correctness criteria is done formally, as in model checking, but checking is done using simulation, which is guided by directed vector sequences derived from knowledge of the design and/or the property being checked. Simulation vectors must be effective in targeting the types of bugs designers expect to find rather than some generic coverage metrics. The focus of our work is to generate property-specific testbenches for guided simulation, that are targeted either at proving the correctness of a full CTL property or at finding a bug. This is facilitated by generation of a property-specific model, called a “witness graph”, which captures interesting paths in the design. Starting from an initial abstract model of the design, symbolic model checking, pruning, and refinement steps are applied in an iterative manner, until either a conclusive result is obtained or computing resources are exhausted. The witness graph is annotated with, e.g., state or transition priorities before testbench generation. The overall testbench generation flow, and the iterative flow for witness graph generation are shown
Keywords :
formal verification; graph theory; logic testing; symbol manipulation; correctness criteria; design validation; directed vector sequences; full CTL property; guided simulation; initial abstract model; property-specific witness graph generation; pruning; refinement steps; semi-formal verification; symbolic model checking; transition priorities; Boolean functions; Computational modeling; Computer bugs; Concrete; Data structures; Gold; National electric code; Performance analysis; Testing; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings
Conference_Location :
Munich
ISSN :
1530-1591
Print_ISBN :
0-7695-0993-2
Type :
conf
DOI :
10.1109/DATE.2001.915124
Filename :
915124
Link To Document :
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