Managing Test and Repair of Embedded Memory Subsystem in SoC

This presentation discusses one such IIP targeted towards the test and repair of embedded memories. An advanced technique called the STARtrade (self test and repair) memory system embedded on-chip diagnoses failed memory bits and repairs the failed memory in real time using the redundant resources (row or columns or both) in the memory. The STAR processor itself has four key test and repair functions. They are BIST (built-in-self-test) to create memory specific test patterns, a BIST diagnostics to analyze and identify the failure, BIRA (built-in redundancy analysis), and the repair and redundancy allocation logic with algorithms to reconfigure the memory rows and columns to be topologically efficient post repair