DocumentCode :
3018661
Title :
Verification of Industrial Designs Using A Computing Grid With More than 100 Nodes
Author :
Iyer, Subramanian ; Jain, Jawahar ; Sahoo, Debashis ; Shimizu, Takeshi
Author_Institution :
Univ. of Texas at Austin, TX
fYear :
2005
fDate :
18-21 Dec. 2005
Firstpage :
460
Lastpage :
460
Abstract :
Formal verification, especially error detection, is rapidly increasing in importance with the rising complexity of designs. The main constraint in verification is the total amount of resources available - both time as well as memory. Most attempts at verification only use a single processor. Recently, various attempts have been made to use parallel and distributed methods for verification. However, verification in a Grid-based environment has not yet been very widely adopted. As personal computers gain in computing capacity, the concept of computation grids is gaining acceptance. Here, a grid is a network of machines that may not be dedicated to a specific computational use, but may only be available some of the time. This is a unique environment where massive parallelism is possible by using otherwise idle CPU cycles from a large number of computers. Such processors may even be in geographically diverse locations. We describe a Grid-based verifi- cation environment for detecting errors in a design. We verify user-written assertions as well as properties, e.g. unreachable code, index-out-of-range, that are extracted automatically from the design using a state-of-the-art HDL parser. Such an approach can help the user to quickly find RTL level bugs earlier in the design cycle.
Keywords :
Central Processing Unit; Computer errors; Computer industry; Computer networks; Concurrent computing; Formal verification; Grid computing; Hardware design languages; Microcomputers; Parallel processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2005. Proceedings. 14th Asian
ISSN :
1081-7735
Print_ISBN :
0-7695-2481-8
Type :
conf
DOI :
10.1109/ATS.2005.113
Filename :
1575479
Link To Document :
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