DocumentCode
3018689
Title
Simultaneous diagnostics of electron density and temperature in micoplasma reactor for scanning plasma etching
Author
Hai Wang ; Zhou Xuan ; Li Han ; Wen Li
Author_Institution
Sch. of Mech. & Automotive Eng., Anhui Polytech. Univ., Wuhu, China
fYear
2013
fDate
5-8 Aug. 2013
Firstpage
648
Lastpage
651
Abstract
Microplasma has been applied widely in micro fabrication. The diagnostics of microplasma generated in the scanning plasmas etching system is critical during the system operation. An experimental system is setup to investigate microplasma parameters of the dc-driven microplasmas reactor operating in CHF3 reactive gases at different gas pressure. The electron density and temperature was calculated from the optical emission spectral (OES) of the microplasmas based on Stark broadening of the Balmer lines of the hydrogen, Hβ and Hγ. The results of this paper may provide experimental verification for the optimized design of operative conditions of microplasmas reactor.
Keywords
Stark effect; electron density; microfabrication; microreactors; plasma chemistry; plasma confinement; plasma density; plasma diagnostics; plasma pressure; plasma production; plasma temperature; sputter etching; CHF3 reactive gases; OES; Stark broadening; dc-driven microplasma reactor; electron density; electron temperature; gas pressure; hydrogen Balmer lines; microfabrication; microplasma generation diagnostics; microplasma parameter; optical emission spectral; scanning plasma etching system; simultaneous diagnostics; system operation; Educational institutions; Hydrogen; Inductors; Plasma measurements; Plasma temperature; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
Conference_Location
Beijing
ISSN
1944-9399
Print_ISBN
978-1-4799-0675-8
Type
conf
DOI
10.1109/NANO.2013.6721001
Filename
6721001
Link To Document