Single-filter multi-color CMOS fluorescent contact sensing microsystem

Author

Ho, Derek ; Noor, M. Omair ; Krull, Ulrich J. ; Gulak, Glenn ; Genov, Roman

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada

fYear

2012

fDate

20-23 May 2012

Firstpage

2393

Lastpage

2396

Abstract

A multi-color fluorescent contact sensing microsystem is presented. The microsystem employs a CMOS field-modulated color sensor (FCS) to spectrally detect and differentiate among multiple emission bands, requiring only one on-CMOS longpass filter. A FCS prototype has been fabricated in a standard 0.35μm CMOS technology. The multi-color imaging capability of the FCS microsystem has been validated in the detection of green-emitting and red-emitting quantum dots (QDs) with QD concentration detection limits of 313nM and 78nM, respectively.

Keywords

CMOS image sensors; filters; image colour analysis; microsensors; quantum dots; CMOS field-modulated color sensor; CMOS longpass filter; FCS; QD concentration detection limit; green-emitting detection; multicolor imaging capability; multiple emission band; red-emitting QD; red-emitting quantum dot; singlefilter multicolor CMOS fluorescent contact sensing microsystem; size 0.35 mum; standard CMOS technology; CMOS integrated circuits; Detectors; Image color analysis; Imaging; Logic gates; Quantum dots;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), 2012 IEEE International Symposium on

Conference_Location

Seoul

ISSN

0271-4302

Print_ISBN

978-1-4673-0218-0

Type

conf

DOI

10.1109/ISCAS.2012.6271779

Filename

6271779