Title :
Leakage control with efficient use of transistor stacks in single threshold CMOS
Author :
Johnson, Mark C. ; Somasekhar, Dinesh ; Roy, Kaushik
Author_Institution :
Rose-Hulman Inst. of Technol., Terre Haute, IN, USA
Abstract :
The state dependence of leakage can be exploited to obtain modest leakage savings in CMOS circuits. However, one can modify circuits considering state dependence and achieve larger savings. We identify a low leakage state and insert leakage control transistors only where needed. Leakage levels are on the order of 35% to 90% lower than those obtained by state dependence alone
Keywords :
CMOS logic circuits; fault diagnosis; integrated circuit design; leakage currents; threshold logic; CMOS circuits; leakage control; leakage control transistors; leakage observability measures; low leakage state; single threshold CMOS; state dependence; transistor stacks; CMOS technology; Circuits; Low voltage; Observability; Particle measurements; Permission; Power measurement; Silicon on insulator technology; Threshold voltage; Voltage control;
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
DOI :
10.1109/DAC.1999.781357
