DocumentCode
3019047
Title
Leakage control with efficient use of transistor stacks in single threshold CMOS
Author
Johnson, Mark C. ; Somasekhar, Dinesh ; Roy, Kaushik
Author_Institution
Rose-Hulman Inst. of Technol., Terre Haute, IN, USA
fYear
1999
fDate
1999
Firstpage
442
Lastpage
445
Abstract
The state dependence of leakage can be exploited to obtain modest leakage savings in CMOS circuits. However, one can modify circuits considering state dependence and achieve larger savings. We identify a low leakage state and insert leakage control transistors only where needed. Leakage levels are on the order of 35% to 90% lower than those obtained by state dependence alone
Keywords
CMOS logic circuits; fault diagnosis; integrated circuit design; leakage currents; threshold logic; CMOS circuits; leakage control; leakage control transistors; leakage observability measures; low leakage state; single threshold CMOS; state dependence; transistor stacks; CMOS technology; Circuits; Low voltage; Observability; Particle measurements; Permission; Power measurement; Silicon on insulator technology; Threshold voltage; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location
New Orleans, LA
Print_ISBN
1-58113-092-9
Type
conf
DOI
10.1109/DAC.1999.781357
Filename
781357
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