Title :
A Total Internal Reflection Technique for Time Resolved Measurements of Index of Refraction
Author :
Houser, John R. ; Bernstein, Aaron C. ; Ditmire, Todd
Author_Institution :
Univ. of Texas at Austin, Austin
Abstract :
We present a method using total-internal reflection for measuring small index-of- refraction changes (Deltan=1times10-5). The technique overcomes requirements of diffraction-limited laser performance, is auto-calibrating, and paves the way for sensitive single-shot ultrafast measurements of material dynamics.
Keywords :
high-speed optical techniques; light diffraction; light reflection; refractive index; time resolved spectra; time resolved spectroscopy; autocalibration; material dynamics; refraction index; single-shot ultrafast measurements; time resolved measurements; total internal reflection; Charge coupled devices; Laser beams; Optical diffraction; Optical reflection; Optical refraction; Optical sensors; Phase measurement; Plasma measurements; Time measurement; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453370
