DocumentCode
3019129
Title
Thermal management for high performance integrated circuits with non-uniform chip power considerations
Author
Yuan, Tsorng-Dih ; Hong, Bor Zen ; Chen, Howard H. ; Wang, Li-kong
Author_Institution
Microelectron. Div., IBM Corp., Hopewell Junction, NY, USA
fYear
2001
fDate
2001
Firstpage
95
Lastpage
101
Abstract
Thermal management for nonuniform chip power integrated circuits is studied. Circuit chip power analysis was used to generate nonuniform chip power and computational fluid dynamics (CFD) techniques are used to calculate the chip temperature. This paper also presents an integrated thermomechanical analysis of a ceramic ball grid array (CBGA) single chip module (SCM) system under chip power loads. A three-dimensional finite element model (FEM) was used for the sequential heat transfer and mechanical analyses to predict the temperature gradients and associated structural response of stress and deformation of the SCM. The thermomechanical analysis results are used to examine the integral effect of chip power loading conditions and of two design parameters, the substrate and cap materials, on the structural integrity of the modeled CBGA SCM system
Keywords
ball grid arrays; ceramic packaging; circuit analysis computing; computational fluid dynamics; cooling; deformation; finite element analysis; integrated circuit modelling; integrated circuit packaging; power distribution; temperature distribution; thermal management (packaging); thermal stresses; 3D finite element model; CBGA; CBGA SCM system; CFD techniques; cap materials; ceramic ball grid array; chip power loading conditions; chip power loads; chip temperature; circuit chip power analysis; computational fluid dynamics; deformation; design parameters; high performance integrated circuits; integrated thermomechanical analysis; mechanical analysis; nonuniform chip power; nonuniform chip power considerations; nonuniform chip power integrated circuits; sequential heat transfer analysis; single chip module; stress; structural integrity; structural response; substrate materials; temperature gradients; thermal management; thermomechanical analysis; Ceramics; Circuit analysis; Computational fluid dynamics; Energy management; Power generation; Power integrated circuits; Power system modeling; Temperature; Thermal management; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management, 2001. Seventeenth Annual IEEE Symposium
Conference_Location
San Jose, CA
Print_ISBN
0-7803-6649-2
Type
conf
DOI
10.1109/STHERM.2001.915154
Filename
915154
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