• DocumentCode
    3019405
  • Title

    Optical Reflectometry for In-situ Monitoring of Carbon Nanotubes Deposition by Optical Tweezers

  • Author

    Kashiwagi, Ken ; Yamashita, Shinji ; Set, Sze Yun

  • Author_Institution
    Univ. of Tokyo, Tokyo
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Reflectometry is adopted for in-situ monitoring of carbon nanotubes deposition to fiber end by optical tweezers. Reflectivity increases drastically once CNTs are deposited, and enhancement of layer uniformity is observed through damping of reflectivity fluctuation.
  • Keywords
    carbon nanotubes; radiation pressure; reflectivity; reflectometry; C; carbon nanotube deposition; optical reflectometry; optical tweezers; reflectivity fluctuation; Carbon nanotubes; Erbium-doped fiber amplifier; Monitoring; Optical attenuators; Optical refraction; Optical sensors; Optical variables control; Reflectivity; Reflectometry; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/CLEO.2007.4453384
  • Filename
    4453384
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3019405