DocumentCode :
3019478
Title :
An electromagnetically-driven MEMS micromirror for laser projection
Author :
Muyu Chen ; Yu Huijun ; Shuai Guo ; Run Xu ; Wenjiang Shen
Author_Institution :
Key Lab. of Nanodevices & Applic., Suzhou Inst. of Nano-tech & Nano-bionics, Suzhou, China
fYear :
2015
fDate :
7-11 April 2015
Firstpage :
605
Lastpage :
607
Abstract :
MEMS micromirror has a wide range of applications, such as laser projection, optical communication, lighting detection and ranging medical imaging detection. In this paper, an electromagnetically-driven biaxial scanning micromirror for laser projection is designed and fabricated which has large deflection angle and linear mechanical properties. Finite Element Method (FEM) is used to design and optimize its mechanical structure parameters. Test results indicate that the mechanical deflection angle of slow scan axis and fast scan axis are ±7.5° and ±12.5° respectively,the angular resolution is better than 2 μrad. According to the measured amplitude-frequency characteristic curve, the resonant frequency of fast scan axis is about 14395Hz and its quality factor Q is 1300. Four-terminal piezoresistive sensors are integrated on the fast and slow axes,the sensitivity of the sensors is 2.6 mV/V@1deg. Finally, the laser projection based on raster scanning of the micromirror is demonstrated and SVGA image resolution is achieved.
Keywords :
Q-factor; finite element analysis; image resolution; integrated optics; micro-optomechanical devices; micromirrors; optical design techniques; optical fabrication; optical projectors; piezoresistive devices; FEM; SVGA image resolution; amplitude-frequency characteristic curve; electromagnetically-driven MEMS micromirror; electromagnetically-driven biaxial scanning micromirror; fast scan axis; finite element method; large deflection angle; laser projection; linear mechanical properties; mechanical deflection angle; mechanical structure parameters; micromechanical devices; optimization; piezoresistive sensors; quality factor; raster scanning; slow scan axis; Finite element analysis; Micromechanical devices; Micromirrors; Piezoresistance; Resonant frequency; Sensors; MEMS micromirror; electromagnetically-driven; laser projection; performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2015 IEEE 10th International Conference on
Conference_Location :
Xi´an
Type :
conf
DOI :
10.1109/NEMS.2015.7147502
Filename :
7147502
Link To Document :
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