DocumentCode
3019747
Title
A novel random projection model for Linear Discriminant Analysis based face recognition
Author
Liu, Hui ; Chen, Wen-Sheng
Author_Institution
Dept. of Inf. & Comput. Sci., Shenzhen Univ., Shenzhen, China
fYear
2009
fDate
12-15 July 2009
Firstpage
112
Lastpage
117
Abstract
Linear discriminant analysis (LDA) is one of the commonly used statistical methods for feature extraction in face recognition tasks. However, LDA often suffers from the small sample size (3S) problem, which occurs when the total number of training data is smaller than the dimension of input feature space. To deal with 3S problem, this paper proposes a novel approach for LDA-based face recognition using random projection (RP) technique. The advantages of random projection mainly include three aspects such as data-independent, dimensionality reduction and approximate distance preservation. So, based on the Johnson-Lindenstrauss theory, a new RP model is proposed for dimensionality reduction and simultaneously for learning the structure of the manifold with high accuracy. If the within-class scatter matrix is nonsingular in the randomly mapped feature space, LDA can be performed directly. Otherwise, RP will be followed by our previous regularized discriminant analysis (RDA) approach for face recognition. Two public available databases, namely FERET and CMU PIE databases, are selected for evaluation. Comparing with PCA, DLDA and Fisherface approaches, our proposed method gives the best performance.
Keywords
face recognition; statistical analysis; Johnson-Lindenstrauss theory; dimensionality reduction; face recognition; feature extraction; linear discriminant analysis; random projection model; regularized discriminant analysis; small sample size; training data; Eigenvalues and eigenfunctions; Face recognition; Linear discriminant analysis; Null space; Pattern recognition; Principal component analysis; Scattering; Spatial databases; Training data; Wavelet analysis; Face recognition; Linear discriminant analysis; Random projection; Small sample size problem;
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition, 2009. ICWAPR 2009. International Conference on
Conference_Location
Baoding
Print_ISBN
978-1-4244-3728-3
Electronic_ISBN
978-1-4244-3729-0
Type
conf
DOI
10.1109/ICWAPR.2009.5207431
Filename
5207431
Link To Document