Title :
Photonic force microscopy with back-scattered light
Author :
Volpe, Giovanni ; Kozyreff, Gregory ; Petrov, Dmitri
Author_Institution :
ICFO-Inst. de Ciencies Fotoniques, Castelldefels
Abstract :
We compare the sensitivity of the photonic force microscope for the forward-scattering and backward- scattering geometries, calculating the total-scattered electromagnetic field from a dielectric bead in an optical trap using a Mie-Debye approach.
Keywords :
Mie scattering; backscatter; light scattering; radiation pressure; Mie Debye; backscattered light; backward scattering geometries; dielectric bead; forward scattering; optical trap; photonic force microscopy; sensitivity; total scattered electromagnetic field; Dielectrics; Electromagnetic fields; Electromagnetic scattering; Geometrical optics; Light scattering; Mie scattering; Optical microscopy; Optical scattering; Optical sensors; Particle scattering;
Conference_Titel :
Lasers and Electro-Optics, 2007. CLEO 2007. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/CLEO.2007.4453399
