Title :
Biporous heat pipes for high power electronic device cooling
Author :
Wang, Jinliang ; Catton, Ivan
Author_Institution :
Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
Abstract :
A biporous heat pipe is proposed to overcome heat transfer crises in the evaporator. The two levels of pore sizes of the biporous heat pipe result in high heat pipe performance. When vaporization phenomena occur in biporous wicks, bubbles formed in the near wall layer easily escape from the porous media and the possibility of vapor blanket layer formation on the heating surface decreases. Evaporation mostly occurs on the smaller surface pores. This not only increases the heat transfer performance by extended surface and smaller pore sizes, but also increases the capillary force which enables the liquid supply. The biporous structure improves the vapor and liquid distribution in the porous media when vaporization phenomena occur in it. Thermal analysis of a solid copper heat spreader and monoporous and biporous heat pipe modules are performed. Compression of the results shows the heat transfer performance of the monoporous and biporous heat pipes are better than the solid copper spreader and the biporous heat pipe has an advantage in the relatively high heat flux range. The biporous heat pipe is very attractive for high power electronic device cooling
Keywords :
bubbles; capillarity; cooling; evaporation; heat pipes; modules; porosity; power semiconductor devices; semiconductor device packaging; thermal analysis; thermal management (packaging); Cu; biporous heat pipe modules; biporous heat pipes; biporous structure; biporous wicks; bubbles; capillary force; evaporation; evaporator; extended surface; heat flux range; heat pipe performance; heat transfer; heat transfer performance; heating surface; liquid distribution; liquid supply; monoporous heat pipe modules; near wall layer; pore size; porous media; power electronic device cooling; solid copper heat spreader; surface pores; thermal analysis; vapor blanket layer formation; vapor distribution; vaporization phenomena; Copper; Electronics cooling; Heat engines; Heat transfer; Microchannel; Solids; Temperature distribution; Thermal conductivity; Thermal management of electronics; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2001. Seventeenth Annual IEEE Symposium
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6649-2
DOI :
10.1109/STHERM.2001.915180