Title :
Temperature sensors placement strategy for fault diagnosis in integrated circuits
Author :
Bratek, Piotr ; Kos, Andrzej
Author_Institution :
Inst. of Electron., Univ. of Min. & Metall., Kracow, Poland
Abstract :
In this paper, we present a new temperature sensor placement strategy. This placement method is proposed for fault diagnosis in integrated circuits (ICs). Simulation results of the new concept sensor placement strategy are presented. Statistical analyses of the yield of this testing method are shown
Keywords :
circuit simulation; failure analysis; fault diagnosis; integrated circuit layout; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; integrated circuit yield; statistical analysis; temperature distribution; temperature sensors; thermal analysis; fault diagnosis; integrated circuits; sensor placement method; sensor placement strategy; simulation; statistical analysis; temperature sensor placement strategy; test yield; testing method; Circuit simulation; Circuit testing; Electronic mail; Fault diagnosis; Multichip modules; Silicon; Statistical analysis; Temperature sensors; Thermal conductivity; Thermal sensors;
Conference_Titel :
Semiconductor Thermal Measurement and Management, 2001. Seventeenth Annual IEEE Symposium
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6649-2
DOI :
10.1109/STHERM.2001.915185
