DocumentCode
3019910
Title
Contactless testing of on-chip oscillator operation
Author
Filanovsky, Igor M. ; Moore, Brian
Author_Institution
Dept. of ECE, Univ. of Alberta, Edmonton, AB, Canada
fYear
2012
fDate
20-23 May 2012
Firstpage
2605
Lastpage
2608
Abstract
The on-chip oscillator operation can be verified in a contactless way if the oscillator tank inductance is also used as a transmitting antenna. When the probing (receiver) antenna located on the test head is close to the oscillator, both antennas together may be considered as a transformer. The receiving antenna moving to and from the oscillator disturbs the oscillation frequency and amplitude, and these disturbances are registered by the measuring device connected to the receiving antenna. These disturbances, which are not occurring in ordinary oscillators with constant components, are evaluated using the equivalent circuit of thus formed transformer. The variation of frequency and the primary and secondary amplitudes as functions of distance between antennas are calculated. The results are experimentally verified with the oscillator realized in 0.13 μm CMOS technology.
Keywords
CMOS integrated circuits; MMIC oscillators; equivalent circuits; receiving antennas; transmitting antennas; CMOS technology; contactless testing; disturbances; equivalent circuit; on-chip oscillator operation; oscillation amplitude; oscillation frequency; oscillator tank inductance; receiver antenna; size 0.13 mum; transformer; transmitting antenna; Antenna measurements; Antennas; Capacitance; Coils; Inductance; Oscillators; Testing; Amplitude and Frequency Disturbances; Contactless testing; Sensors; Transformer Oscillator;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location
Seoul
ISSN
0271-4302
Print_ISBN
978-1-4673-0218-0
Type
conf
DOI
10.1109/ISCAS.2012.6271838
Filename
6271838
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