Total charge injection cancellation scheme for high precision second-generation switched-current circuits

Author

Zeng, X. ; Tse, G.K. ; Tang, P.S.

Author_Institution

Dept. of Electron. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong

Volume

1

fYear

1996

fDate

12-15 May 1996

Firstpage

413

Abstract

In this paper, a new scheme is proposed to completely cancel both signal-dependent and signal-independent charge injection errors in second-generation switched-current circuits. The n-step principle has been employed to suppress the signal-dependent distortion error while the circuit-replication technique has been adopted to simultaneously diminish the signal-independent offset. SPICE simulations have verified the feasibility and effectiveness of the proposed cell for tackling the charge injection problem. Major merits of the proposed cell include capability to meet high precision requirements and applicability to any second-generation switched-current circuit configuration

Keywords

SPICE; VLSI; circuit analysis computing; integrated circuit design; mixed analogue-digital integrated circuits; switched current circuits; SPICE simulations; circuit-replication technique; n-step principle; second-generation switched-current circuits; signal-dependent charge injection errors; signal-independent charge injection errors; signal-independent offset; total charge injection cancellation; Capacitance; Circuit simulation; Circuit synthesis; Clocks; Distortion; SPICE; Switches; Switching circuits; Threshold voltage; Zero voltage switching;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-3073-0

Type

conf

DOI

10.1109/ISCAS.1996.539972

Filename

539972