• DocumentCode
    3020138
  • Title

    Tuning of resistance of nanogaps using field-emission-induced electromigration with feedback control scheme

  • Author

    Ando, Makoto ; Akimoto, S. ; Suda, Ryutaro ; Shirakashi, Jun-ichi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Tokyo Univ. of Agric. & Technol., Koganei, Japan
  • fYear
    2013
  • fDate
    5-8 Aug. 2013
  • Firstpage
    1141
  • Lastpage
    1144
  • Abstract
    We report a newly investigated technique for the tuning of tunnel resistance of nanogaps using electromigration phenomena induced by a field emission current, which is called “activation” method. First, Planar-type initial nanogaps of Ni separated by 20-50 nm were defined on SiO2/Si substrates. Then, a bias current was applied to the initial Ni nanogaps at room temperature using a current source. Here, we propose a feedback approach during activation procedures, in order to precisely control the resistance of nanogaps at room temperature. We call this method “feedback-controlled activation (FCA)”, and it is revealed that control characteristics of tunnel resistance of nanogaps are successfully improved using FCA procedure, as compared with conventional activation without feedback scheme. These results indicate that a feedback approach is useful for the stable control of tunnel resistance of nanogaps using activation method.
  • Keywords
    electromigration; energy gap; feedback; field emission; nanostructured materials; FCA procedure; Ni separation; SiO2-Si substrates; SiO2-Si; activation method; activation procedure; bias current; current source; feedback control scheme; feedback-controlled activation; field emission current; field-emission-induced electromigration; initial Ni nanogaps; nanogap resistance control; nanogap resistance tuning; planar-type initial nanogaps; size 20 nm to 50 nm; temperature 293 K to 298 K; tunnel resistance control; tunnel resistance tuning; Electrodes; Electromigration; Histograms; Junctions; Nickel; Resistance; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2013 13th IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4799-0675-8
  • Type

    conf

  • DOI
    10.1109/NANO.2013.6721060
  • Filename
    6721060