• DocumentCode
    3020267
  • Title

    Numerical investigation on the junctionless nanowire FET

  • Author

    Gnani, E. ; Gnudi, A. ; Reggiani, S. ; Baccarani, G. ; Shen, N. ; Singh, N. ; Lo, G.Q. ; Kwong, D.L.

  • Author_Institution
    ARCES-DEIS, Univ. of Bologna, Bologna, Italy
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this work we investigate by numerical simulation the electrical properties of the junctionless nanowire field-effect transistor, which has recently been proposed as a possible alternative to the junction-based FET. The numerical model assumes a cylindrical geometry and is meant to provide a physical understanding of the device behavior by highlighting the features of the I-V and C-V characteristics, as well as the electrostatic potential and carrier concentration within the channel. Numerical results are compared with the experimental turn-on characteristics and are found to provide a generally-good agreement. Finally, we discuss the strengths and the limitations of this device as a possible candidate for future technology nodes.
  • Keywords
    field effect transistors; nanowires; numerical analysis; C-V characteristics; I-V characteristics; carrier concentration; cylindrical geometry; electrical property; electrostatic potential; junctionless nanowire FET; junctionless nanowire field-effect transistor; numerical investigation; numerical model; numerical simulation; Capacitance; Electric potential; Impurities; Junctions; Logic gates; Neodymium; Schottky barriers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2011 12th International Conference on
  • Conference_Location
    Cork
  • Print_ISBN
    978-1-4577-0090-3
  • Electronic_ISBN
    978-1-4577-0089-7
  • Type

    conf

  • DOI
    10.1109/ULIS.2011.5757981
  • Filename
    5757981