DocumentCode
3020268
Title
A model for crosstalk noise evaluation in deep submicron processes
Author
Sabet, Pirouz Bazargan ; Ilponse, Fabrice
Author_Institution
Paris VI Univ., France
fYear
2001
fDate
2001
Firstpage
139
Lastpage
144
Abstract
To certify, the correctness of a design, in deep submicron technologies, the verification process has to cover some new issues. The noise introduced on signals through the crosstalk coupling is one of these emerging problems. In this paper, we propose a model to evaluate the peak value of the noise injected on a signal during the transition of its neighboring signals. This model has been used in a prototype verification tool and has shown a satisfying accuracy within a reasonable computation delay
Keywords
VLSI; crosstalk; integrated circuit design; integrated circuit modelling; integrated circuit noise; crosstalk coupling; crosstalk noise evaluation model; deep submicron processes; peak noise value; verification tool; Capacitance; Circuit noise; Coupling circuits; Crosstalk; Delay; Design methodology; Integrated circuit technology; Signal processing; Steady-state; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2001 International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-1025-6
Type
conf
DOI
10.1109/ISQED.2001.915218
Filename
915218
Link To Document