Title :
A statistical learning approach to document image analysis
Author :
Laven, Kevin ; Leishman, Scott ; Roweis, Sam
Author_Institution :
Dept. of Comput. Sci., Toronto Univ., Ont., Canada
fDate :
29 Aug.-1 Sept. 2005
Abstract :
In the field of computer analysis of document images, the problems of physical and logical layout analysis have been approached through a variety of heuristic, rule-based, and grammar-based techniques. In this paper we investigate the effectiveness of statistical pattern recognition algorithms for solving these two problems, and report results suggesting that these more complex and powerful techniques are worth pursuing. First, we developed a new software environment for manual page image segmentation and labeling, and used it to create a dataset containing 932 page images from academic journals. Next, a physical layout analysis algorithm based on a logistic regression classifier was developed, and found to outperform existing algorithms of comparable complexity. Finally, three statistical classifiers were applied to the logical layout analysis problem, also with encouraging results.
Keywords :
document image processing; image segmentation; knowledge based systems; learning (artificial intelligence); pattern classification; regression analysis; academic journals; document image analysis; grammar-based techniques; heuristic techniques; logical layout analysis; logistic regression classifier; manual page image segmentation; page labeling; physical layout analysis algorithm; rule-based techniques; software environment; statistical classifiers; statistical learning approach; statistical pattern recognition algorithm; Computer science; Image analysis; Image segmentation; Ink; Labeling; Pattern recognition; Software packages; Statistical learning; Tagging; Text analysis;
Conference_Titel :
Document Analysis and Recognition, 2005. Proceedings. Eighth International Conference on
Print_ISBN :
0-7695-2420-6
DOI :
10.1109/ICDAR.2005.32