DocumentCode
3020482
Title
A linear subspace learning algorithm for incremental data
Author
Fang, Bin ; Chen, Jing ; Tang, Yuan-yan
Author_Institution
Sch. of Comput., Chongqing Univ., Chongqing, China
fYear
2009
fDate
12-15 July 2009
Firstpage
101
Lastpage
106
Abstract
Incremental learning has attracted increasing attention in the past decade. Since many real tasks are high-dimensional problems, dimensionality reduction is the important step. Principal Component Analysis (PCA) and Linear Discriminant Analysis (LDA) are two of the most widely used dimensionality reduction algorithms. However, PCA is an unsupervised algorithm. It is known that PCA is not suitable for classification tasks. Generally, LDA outperforms PCA when classification problem is involved. However, the major shortcoming of LDA is that the performance of LDA is degraded when encountering singularity problem. Recently, the modified LDA, Maximum margin criterion (MMC) was proposed to overcome the shortcomings of PCA and LDA. Nevertheless, MMC is not suitable for incremental data. The paper proposes an incremental extension version of MMC, called Incremental Maximum margin criterion (IMMC) to update projection matrix when new observation is coming, without repetitive learning. Since the approximation intermediate eigenvalue decomposition is introduced, it is low in computational complexity.
Keywords
computational complexity; learning (artificial intelligence); matrix algebra; pattern classification; principal component analysis; classification tasks; computational complexity; dimensionality reduction algorithms; incremental data; incremental learning; incremental maximum margin criterion; linear discriminant analysis; linear subspace learning algorithm; principal component analysis; projection matrix; unsupervised algorithm; Algorithm design and analysis; Computational complexity; Eigenvalues and eigenfunctions; Feature extraction; Linear discriminant analysis; Matrix decomposition; Pattern recognition; Principal component analysis; Scattering; Wavelet analysis; Dimensionality reduction; Incremental Maximum margin criterion (IMMC); Incremental learning; Linear discriminant analysis (LDA); Maximum margin criterion (MMC);
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition, 2009. ICWAPR 2009. International Conference on
Conference_Location
Baoding
Print_ISBN
978-1-4244-3728-3
Electronic_ISBN
978-1-4244-3729-0
Type
conf
DOI
10.1109/ICWAPR.2009.5207464
Filename
5207464
Link To Document