DocumentCode :
3020509
Title :
Variation-resilient current-mode logic circuit design using MTJ devices
Author :
Kim, Youngkeun ; Natsui, Masanori ; Hanyu, Takahiro
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
fYear :
2012
fDate :
20-23 May 2012
Firstpage :
2705
Lastpage :
2708
Abstract :
A current-mode logic-circuit style using MTJ devices as threshold voltage (Vth) variation compensating elements is proposed for realizing a process-variation-aware VLSI processor with maintaining a higher performance capability. The faulty logic-operation behavior due to Vth variation of each MOS transistor can be neglected by adjusting resistance values of MTJ devices that are connected to the source electrode of MOS transistors in series. By using HSPICE simulation under a 90nm CMOS technology, it is demonstrated that basic current-mode logic gates using the proposed method are robust against the Vth variation.
Keywords :
CMOS logic circuits; MOSFET; current-mode circuits; current-mode logic; logic circuits; logic design; CMOS technology; HSPICE simulation; MOS transistor; MTJ devices; faulty logic-operation behavior; process-variation-aware VLSI processor; resistance values; source electrode; threshold voltage; variation-resilient current-mode logic circuit design; Logic gates; MOSFETs; Magnetic tunneling; Performance evaluation; Resistance; Threshold voltage; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
ISSN :
0271-4302
Print_ISBN :
978-1-4673-0218-0
Type :
conf
DOI :
10.1109/ISCAS.2012.6271866
Filename :
6271866
Link To Document :
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