Title :
A reference low-complexity structured ASIC
Author :
Noury, Ludovic ; Dupuis, Sophie ; Fel, Nicolas
Author_Institution :
ESYCOM, Univ. Paris-Est, Noisy-le-Grand, France
Abstract :
Structured ASICs are designed to bridge the gap between ASICs and FPGAs in terms of cost and performance. By predefining most of the manufacturing masks they highly reduce time-to-market (TTM), non-recoverable engineering (NRE) costs and lithography hazards while exhibiting higher performances than FPGAs thanks to hardwired configuration and interconnections. Many structured ASICs architectures aiming at achieving high performances have been proposed, their delay, power consumption and area have been evaluated and compared to standard cells implementations. However, the evaluation of their cost in terms of dedicated software development, full custom design, cells libraries development and comparison with structured ASICs using the same process is seldom investigated. In this paper, we present a structured ASIC which minimizes full-custom design complexity, technology migration cost and ensures compatibility with an unmodified industrial design flow. We evaluate its performance in a 65 nm process and compare it to standard cells and FPGA implementations. Our goal with this “simple” structured ASIC is to provide a reference which allows to evaluate if performance gains due to design enhancements outweigh higher complexity and costs.
Keywords :
application specific integrated circuits; integrated circuit interconnections; lithography; reference circuits; FPGA; cells libraries; delay; hardwired configuration; interconnections; lithography hazards; manufacturing masks; nonrecoverable engineering costs; power consumption; reference low-complexity ASIC; size 65 nm; structured ASIC; technology migration; time-to-market; Application specific integrated circuits; Delay; Field programmable gate arrays; Libraries; Logic gates; Standards; Tiles;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6271867