Title :
Diversity techniques for concurrent error detection
Author :
Mitra, Subhasish ; McCluskey, Edward J.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Abstract :
Concurrent error detection (CED) techniques are widely used to ensure data integrity in digital systems. Data integrity guarantees that the system outputs are either correct or an error is indicated when incorrect outputs are produced. This dissertation presents the results of theoretical and simulation studies of various CED techniques. The CED schemes studied are based on diverse duplication, simple duplication of identical implementations, and error-detection techniques like parity checking. The study aimed at (1) a quantitative comparison of the effectiveness different CED schemes, and (2) developing design techniques for efficient concurrent error detection
Keywords :
concurrency theory; data integrity; digital systems; error detection; common mode failure; concurrent error detection; data integrity; design diversity; digital system; diverse duplication; fault model; parity checking; Algorithm design and analysis; Analytical models; Computer errors; Concurrent computing; Digital systems; Electromagnetic interference; Error correction; Failure analysis; Laboratories; Redundancy;
Conference_Titel :
Quality Electronic Design, 2001 International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-1025-6
DOI :
10.1109/ISQED.2001.915234
