Title :
Fine-grained splitting methods to address permanent errors in Network-on-Chip links
Author :
Zhang, Meilin ; Yu, Qiaoyan ; Ampadu, Paul
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
Abstract :
We propose a series of fine-grained splitting transmission methods to address permanent errors in Network-on-Chip (NoC) links, maintaining high throughput and ensuring reliability. While prior permanent error management approaches discard the entire or half link, our proposed methods greatly improve wire utilization in the presence of permanent errors. A case study shows that our methods achieve throughput improvement of 234% and 56%, respectively, compared to fault-tolerant routing and half-splitting methods in the presence of high number of permanent errors.
Keywords :
integrated circuit reliability; network-on-chip; fine-grained splitting method; fine-grained splitting transmission method; network-on-chip links; permanent error management; reliability; wire utilization; Fault tolerance; Fault tolerant systems; Receivers; Routing; Throughput; Transmitters; Wires;
Conference_Titel :
Circuits and Systems (ISCAS), 2012 IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4673-0218-0
DOI :
10.1109/ISCAS.2012.6271869