DocumentCode
3020822
Title
Green´s function analysis of Lamb wave resonators
Author
Kuypers, Jan H. ; Pisano, Albert P.
Author_Institution
Dept. of Mech. Eng., Univ. of California at Berkeley, Berkeley, CA
fYear
2008
fDate
2-5 Nov. 2008
Firstpage
1548
Lastpage
1551
Abstract
We have extended the K-model, a Green´s function model previously developed for the precise simulation of surface acoustic wave (SAW) device at radio frequencies (RF), to the computation of Lamb wave resonators (LWR). The effective permittivity for Lamb wave excitation on thin aluminum nitride plates with different electrode configurations is compared. The results of the electromechanical coupling coefficient k2 computed from the effective permittivity agree closely with the classical approximation based on the open and shorted velocities v0 and vm. Although a backside metallization increases the value of k2 the frequency spacing of resonance and anti-resonance is reduced due to capacitive feedthrough through the bottom electrode. Finally, we demonstrate the ability of the model to predict the numerous spurious modes that are excited with low-electrode-count interdigital transducers (IDT).
Keywords
Green´s function methods; III-V semiconductors; aluminium compounds; interdigital transducers; metallisation; permittivity; surface acoustic wave resonators; surface acoustic wave transducers; wide band gap semiconductors; AlN; Green´s function analysis; K-model method; Lamb wave resonators; backside metallization; electromechanical coupling coefficient; low-electrode-count interdigital transducers; permittivity; resonance frequency spacing; surface acoustic wave device; thin aluminum nitride plates; Acoustic waves; Aluminum nitride; Computational modeling; Electrodes; Green´s function methods; Metallization; Permittivity; Radio frequency; Surface acoustic wave devices; Surface acoustic waves; Aluminum Nitride; Effective Permittivity; K-Model; Lamb Waves; Narrowband filters;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location
Beijing
Print_ISBN
978-1-4244-2428-3
Electronic_ISBN
978-1-4244-2480-1
Type
conf
DOI
10.1109/ULTSYM.2008.0377
Filename
4803382
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