DocumentCode :
3020822
Title :
Green´s function analysis of Lamb wave resonators
Author :
Kuypers, Jan H. ; Pisano, Albert P.
Author_Institution :
Dept. of Mech. Eng., Univ. of California at Berkeley, Berkeley, CA
fYear :
2008
fDate :
2-5 Nov. 2008
Firstpage :
1548
Lastpage :
1551
Abstract :
We have extended the K-model, a Green´s function model previously developed for the precise simulation of surface acoustic wave (SAW) device at radio frequencies (RF), to the computation of Lamb wave resonators (LWR). The effective permittivity for Lamb wave excitation on thin aluminum nitride plates with different electrode configurations is compared. The results of the electromechanical coupling coefficient k2 computed from the effective permittivity agree closely with the classical approximation based on the open and shorted velocities v0 and vm. Although a backside metallization increases the value of k2 the frequency spacing of resonance and anti-resonance is reduced due to capacitive feedthrough through the bottom electrode. Finally, we demonstrate the ability of the model to predict the numerous spurious modes that are excited with low-electrode-count interdigital transducers (IDT).
Keywords :
Green´s function methods; III-V semiconductors; aluminium compounds; interdigital transducers; metallisation; permittivity; surface acoustic wave resonators; surface acoustic wave transducers; wide band gap semiconductors; AlN; Green´s function analysis; K-model method; Lamb wave resonators; backside metallization; electromechanical coupling coefficient; low-electrode-count interdigital transducers; permittivity; resonance frequency spacing; surface acoustic wave device; thin aluminum nitride plates; Acoustic waves; Aluminum nitride; Computational modeling; Electrodes; Green´s function methods; Metallization; Permittivity; Radio frequency; Surface acoustic wave devices; Surface acoustic waves; Aluminum Nitride; Effective Permittivity; K-Model; Lamb Waves; Narrowband filters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2008. IUS 2008. IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2428-3
Electronic_ISBN :
978-1-4244-2480-1
Type :
conf
DOI :
10.1109/ULTSYM.2008.0377
Filename :
4803382
Link To Document :
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