DocumentCode
3020826
Title
Imaging simulation modeling for millimeter wave synthetic aperture imaging radiometer in near-field
Author
Jianfei Chen ; Yuehua Li ; Jianqiao Wang ; Yilong Zhang
Author_Institution
Sch. of Electron. Eng. & Optoelectron. Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
fYear
2013
fDate
20-22 Dec. 2013
Firstpage
632
Lastpage
636
Abstract
Due to the fact that theoretical analysis and instrument construction for antenna array of synthetic aperture imaging radiometer (SAIR) are both complicated, and designers usually hope to predict the imaging effect and analysis the influence of the parameters of SAIR before the system design. The simulation is a very useful method in the system design of SAIR. This paper is devoted to establishing an accurate imaging model of near-field millimeter wave SAIR for simulating the imaging process that include target radiating electromagnetic wave, antenna collecting target radiation and transforming them into RF signal, and antenna array collecting the visibility function. By using the equivalent complex baseband signals to represent the practical target radiation and RF signals in time domain, the efficiency of this simulation model is improved significantly. Some characteristics of near-filed millimeter wave SAIR are verified by a series of simulation experiments, and the effectiveness of this imaging model is tested by these simulation experiments. Results of the imaging simulation experiment show that this model is an efficient, feasible imaging model for near-field millimeter wave SAIR.
Keywords
antenna arrays; radiometers; RF signal; antenna array; antenna collecting target radiation; complex baseband signals; imaging simulation modeling; millimeter wave synthetic aperture imaging radiometer; near-field millimeter wave SAIR; target radiating electromagnetic wave; Antenna arrays; Arrays; Atmospheric modeling; Imaging; Microwave radiometry; Millimeter wave technology; Synthetic aperture; imaging; millimeter wave; radiometers; simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Mechatronic Sciences, Electric Engineering and Computer (MEC), Proceedings 2013 International Conference on
Conference_Location
Shengyang
Print_ISBN
978-1-4799-2564-3
Type
conf
DOI
10.1109/MEC.2013.6885141
Filename
6885141
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