DocumentCode
3020873
Title
Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices
Author
Makovejev, S. ; Kilchytska, V. ; Arshad, M. K Md ; Flandre, D. ; Andrieu, F. ; Faynot, O. ; Olsen, S. ; Raskin, J.P.
Author_Institution
Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
fYear
2011
fDate
14-16 March 2011
Firstpage
1
Lastpage
4
Abstract
Self-heating and substrate effects are discussed and qualitatively compared in the ultra-thin body ultra-thin BOX (UTB2) devices without a ground plane. Ultra-thin body is aggravating thermal properties of the devices due to the interface effects. Ultra-thin BOX (10 nm) improves heat dissipation from the channel to the bulk silicon substrate but also results in strongly pronounced substrate effects. It is observed that output conductance degradation in the UTB2 devices due to the substrate effects can be as strong as degradation due to the self-heating.
Keywords
cooling; silicon-on-insulator; substrates; thermal conductivity; Si; heat dissipation; self-heating effect; silicon substrate; size 10 nm; substrate effect; thermal conductivity; ultra-thin body ultra-thin BOX device; Degradation; Frequency response; Heating; Logic gates; MOSFETs; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultimate Integration on Silicon (ULIS), 2011 12th International Conference on
Conference_Location
Cork
Print_ISBN
978-1-4577-0090-3
Electronic_ISBN
978-1-4577-0089-7
Type
conf
DOI
10.1109/ULIS.2011.5758009
Filename
5758009
Link To Document