• DocumentCode
    3020873
  • Title

    Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices

  • Author

    Makovejev, S. ; Kilchytska, V. ; Arshad, M. K Md ; Flandre, D. ; Andrieu, F. ; Faynot, O. ; Olsen, S. ; Raskin, J.P.

  • Author_Institution
    Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Self-heating and substrate effects are discussed and qualitatively compared in the ultra-thin body ultra-thin BOX (UTB2) devices without a ground plane. Ultra-thin body is aggravating thermal properties of the devices due to the interface effects. Ultra-thin BOX (10 nm) improves heat dissipation from the channel to the bulk silicon substrate but also results in strongly pronounced substrate effects. It is observed that output conductance degradation in the UTB2 devices due to the substrate effects can be as strong as degradation due to the self-heating.
  • Keywords
    cooling; silicon-on-insulator; substrates; thermal conductivity; Si; heat dissipation; self-heating effect; silicon substrate; size 10 nm; substrate effect; thermal conductivity; ultra-thin body ultra-thin BOX device; Degradation; Frequency response; Heating; Logic gates; MOSFETs; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (ULIS), 2011 12th International Conference on
  • Conference_Location
    Cork
  • Print_ISBN
    978-1-4577-0090-3
  • Electronic_ISBN
    978-1-4577-0089-7
  • Type

    conf

  • DOI
    10.1109/ULIS.2011.5758009
  • Filename
    5758009